Lorenz, W. J. and Plieth, W., eds.
WILEY-VCH, 1998 [ISBN 3-527-29520-8]
A new window to local studies of interface phenomena
at solid state surfaces has been opened by the development of local
probe techniques such as Scanning Tunneling Microscopy (STM) or Atomic
Force Microscopy (AFM) and related methods during the past fifteen years.
The in-situ application of local probe methods in different systems
belongs to modern nanotechnology and has two aspects: an analytical
aspect and a preparative aspect.
The first aspect covers the application of the local probe
methods to characterize thermodynamic, structural and dynamic properties
of solid state surfaces and interfaces and to investigate local surface
reactions. Two methods which are still in the beginning of their development
represent the second aspect: tip and cantilever. They can be used to
form defined nano-objects such as molecular or atomic clusters, quantum
dots etc. as well as to structure or modify solid state surfaces in
the nanometer range.
This IUPAC monograph is a comprehensive treatment of both
aspects and presents the current state of knowledge. It is written for
scientists active in the area of nanotechnology.
Part I: General Aspects
Part II: Roughness and Interface Structure
Part III: Surface Modification
Part IV: Nucleation and Electrodeposition
Part V: Oxide Layers and Corrosion
Part VI: Semiconductors
Part VII: STM and Complementary Methods
Wiley-VCH Website for Full version of Contents